Shanghai, Jan 25, 2026, 10:23 CST — Market closed
VeriSilicon Microelectronics (Shanghai) Co., Ltd. projects a roughly 36% jump in revenue for 2025, with its annual loss shrinking. The boost comes as AI computing orders climb and its backlog expands toward year-end.
The Shanghai-listed chip design and IP licensing company projects 2025 revenue around 3.15 billion yuan, marking a 35.81% increase from last year, according to its annual forecast dated Jan. 24. It expects a net loss to shareholders of about 449 million yuan, an improvement from the 601 million yuan loss in 2024. New orders in 2025 are estimated at roughly 5.96 billion yuan, with AI-computing related orders making up more than 73%. Orders on hand are set to climb to approximately 5.08 billion yuan by the end of 2025.
The update arrives as A-share investors shift focus from momentum trading to scrutinizing earnings, putting chip stocks under pressure to prove the AI buildout is moving into contracted projects—and, ultimately, profitability.
Orders on hand offer a rough gauge of future revenue since they reflect signed deals not yet recorded. But they can be misleading too: projects sometimes slip when customers delay tape-out or postpone mass production.
VeriSilicon’s Class A shares ended Friday at 206.60 yuan, up 1.35%. They’ll face their first pricing test when Shanghai markets reopen Monday.
The company’s forecast remained largely unchanged. It said revenue is outpacing costs, yet it continues to invest heavily in research and development, calling it the heart of its business model.
But traders hoping for a clean rerating should note a key caveat: the numbers are preliminary and unaudited, and the company remains unprofitable. A dip in order conversion or pricing pressure as customers hunt for cheaper design options could quickly unravel the narrative.
Monday’s open (Jan. 26) will give investors their first glimpse of sentiment. After that, attention shifts to VeriSilicon’s audited 2025 annual report, where details on margins and cash burn will be closely examined.
